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    Photogalvanic effect in few-layer graphene

    Zhaohang Li1,*, Kainan Chang2,3,*, Haoyu Li2, Yuxuan Gao1, Wei Xin1,†, Jin Luo Cheng2,4,‡, and Haiyang Xu1,§

    • *These authors contributed equally to this work.
    • †Contact author: xinwei@nenu.edu.cn
    • ‡Contact author: jinluocheng.phys@gmail.com
    • §Contact author: hyxu@nenu.edu.cn

    Phys. Rev. B 114, 045428 – Published 24 July, 2026

    DOI: https://doi.org/10.1103/5b59-8zdc

    Abstract

    We systematically investigate the nonlinear photogalvanic effect in few-layer graphene with various stacking orders, including AA- and AB-stacked bilayers, and AAA-, ABA-, and ABC-stacked trilayers. Using a tight-binding model to describe the electronic states, the shift current conductivity and jerk current conductivity are calculated over a broad spectral range from terahertz to visible frequencies. Our symmetry analysis reveals that a nonvanishing shift current emerges only in ABA-stacked trilayer graphene due to its broken inversion symmetry, with a peak conductivity reaching approximately 1.21×10−13 Am/V2 at optimal doping. In contrast, the jerk current, permitted in all structures, requires an in-plane static electric field and exhibits pronounced spectral tunability with chemical potential. These findings provide design principles for tunable, polarization-sensitive photodetection and energy-harvesting devices based on van der Waals few-layer films.

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