Export citation

Export citation

Choose format for download:

Download Citation

    Multiple layer Hall states in the topological magnet V2WS4 family

    Xuqi Li, Hong Xu, Yu Zhang, and Shifei Qi*

    • College of Physics and Hebei Advanced Thin Film Laboratory, Hebei Normal University, Shijiazhuang, Hebei 050024, China

    • *Contact author: qisf@hebtu.edu.cn

    Phys. Rev. B 111, 235427 – Published 12 June, 2025

    DOI: https://doi.org/10.1103/2jdz-kdn1

    Abstract

    Layer Hall effect, where electrons can deflect to opposite directions in different layers of layered antiferromagnetic materials, is a promising physical phenomenon in future spatial-resolved layertronics application. Here, we demonstrate that multiple layer Hall states including layer-polarized Hall, quantized anomalous layer Hall (QALH), and nearly high-Chern-number QALH effects can be sequentially realized in the V2WS4 magnetic topological insulator family. First, with applied external electric field and increased field strength to 0.4 V/Å, layer-polarized Hall and QALH effect with fully quantized Hall conductivity plateau σxy=e2/h begins to appear in the V2WS4 bilayer. Furthermore, by tuning the electric field direction and Fermi level, QALH effect can be effectively switched between layers and the number of peaks in Hall conductivity σxy exhibits a pronounced parity-dependent behavior. Remarkably, through synergetic modulation of external magnetic and electric fields, a nearly high-Chern-number QALH effect can be observed in an odd-layer V2WS4 system. The above findings provide a nearly ideal topological magnet family harboring various layer Hall effects especially with fully quantized-layered transport.

    Physics Subject Headings (PhySH)

    Authorization Required

    We need you to provide your credentials before accessing this content.

    Supplemental Material (Subscription Required)

    References (Subscription Required)

    Outline

    Information

    Sign In to Your Journals Account

    Filter

    Filter

    Article Lookup

    Enter a citation