Identify the switching of and and its effect on ferroelectric hafnia
Phys. Rev. B 113, 134109 – Published 13 April, 2026
DOI: https://doi.org/10.1103/2j8c-3z3h
Abstract
thin films are recognized as pivotal materials for next-generation ferroelectric memories, and extensive experimental efforts have been dedicated to defect-engineering -based systems towards tailored ferroelectric properties. However, the microscopic mechanisms through which excess electrons modulate the defect states and doping behavior in remain not fully understood, which has slowed progress in the field. To fill this gap, we investigate the interaction mechanisms between aliovalent dopants and oxygen vacancies () in by subspace corrected (PBE+ functional) density functional theory simulations. Our results reveal that the extra charge introduced by trivalent dopants forms a small polaron localized on a tricoordinated oxygen atom, producing a deep empty defect state within the band gap. This deep defect state can interact with the excess electrons generated by oxygen vacancies, thereby enhancing the stability of the three-coordinated oxygen vacancy () configuration compared to the four-coordinated one (). The introduction of lowers the local polarization-switching barrier near a statistical accumulation of vacancies by 13%, while produces a more pronounced reduction of 60%, corresponding to a minimum barrier of 0.12eV/u.c. The stabilized center effectively reduces the ferroelectric switching barrier in the phase by promoting reduced atomic displacements and lattice distortions, significantly decreasing the coercive field of . These findings provide critical insights for advancing the fundamental understanding of materials and establishing design guidelines for constructing defect-tolerant ferroelectric devices through targeted defect engineering.