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    Single-shot near-field reconstruction of metamaterial dispersion

    Eugene A. Koreshin1,*, Denis Sakhno1,2, Jim A. Enriquez1, and Pavel A. Belov1,2

    • 1School of Physics and Engineering, ITMO University, Kronverksky Prospekt 49, 197101 St. Petersburg, Russia
    • 2School of Engineering, New Uzbekistan University, Movarounnahr street 1, 100000 Tashkent, Uzbekistan

    • *Contact author: evgeniy.koreshin@metalab.ifmo.ru

    Phys. Rev. B 113, 104302 – Published 9 March, 2026

    DOI: https://doi.org/10.1103/1hqf-wj91

    Abstract

    We present a single-shot near-field technique, where the near-field scan is performed on a single sample without repeating measurements or averaging over multiple samples, to reconstruct the isofrequency surfaces of metamaterials in the microwave regime. In our approach, we excite resonant modes using a fixed source in a resonator composed of the material under test and map the in-plane field distribution with a movable probe. Applying a fast Fourier transform to the measured field reveals the sample's in-plane dispersion. By extending this analysis over multiple frequencies and comparing the results with Fabry-Pérot resonances, we retrieve the full three-dimensional dispersion relation. When we apply the method to a double nonconnected wire metamaterial, it accurately captures the low-frequency hyperbolic isofrequency surface, providing both a precise experimental tool and conceptual insight into spatially dispersive metamaterials.

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