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Quantum-enhanced electric field mapping within semiconductor devices

D. Scheller^1,*, F. Hrunski ^1,*, J.H. Schwarberg ², W. Knolle³, Ö.O. Soykal⁴, P. Udvarhelyi ⁵, P. Narang ^6,7, H.B. Weber ⁸, M. Hollendonner^1,† et al.

R. Nagy ¹

¹Insitute of Applied Quantum Technologies, Friedrich-Alexander-University Erlangen-Nürnberg, 91052 Erlangen, Germany
²Chair of Electron Devices, Friedrich-Alexander-University Erlangen-Nürnberg, 91058 Erlangen, Germany
³Department of Sensoric Surfaces and Functional Interfaces, Leibniz-Institute of Surface Engineering (IOM), 04318 Leipzig, Germany
⁴Photonic Inc., Coquitlam, British Columbia, V3K 6T1, Canada
⁵Department of Chemistry and Biochemistry, University of California, Los Angeles, California 90095, USA
⁶Division of Physical Sciences, College of Letters and Science, University of California, Los Angeles, California 90095, USA
⁷Department of Electrical and Computer Engineering, University of California, Los Angeles, California 90095, USA
⁸Chair of Applied Physics, Friedrich-Alexander-University Erlangen-Nürnberg, 91058 Erlangen, Germany

^*These authors contributed equally.
^†Contact author: maximilian.hollendonner@fau.de

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Articles Citing

Quantum-enhanced electric field mapping within semiconductor devices

Device engineering for photocurrent detected magnetic resonance and scanning probes using solid-state spin defects

Imaging magnetic fields from electrical signals in a quantum SiC microscope

Statistical imaging of N- V centers reveals clustered defect formation in diamond

Waveguide-integrated colour centres in silicon carbide with broadband photonic crystal reflectors for efficient readout

Photoionization Current Spectroscopy of Individual Silicon Vacancies in Silicon Carbide

Impact of Surface Treatment on Noise in PL Measurements of Silicon Vacancies in 4H-SiC Lateral PIN-Diodes

Control and tuning of color centers in 4H silicon carbide by application of electric field via Schottky diode

Scalable Fabrication and Electrical Characterization of Lateral Pin-Diodes on 4H-SiC A-Plane Wafers for Functionalization of Silicon Vacancies

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Quantum Electrometry of Non‐Volatile Space Charges in Diamond

Engineering chlorine-based emitters in silicon carbide for telecom-band quantum technologies

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