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Physical Review Applied

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Advanced Scientific Instruments (1)

Articles Citing

Thermal analysis of GaN-based photonic membranes for optoelectronics

Wilken Seemann^*, Mahmoud Elhajhasan , Julian Themann, Katharina Dudde , Guillaume Würsch , Jana Lierath , and Gordon Callsen ^†

Joachim Ciers and Åsa Haglund

Nakib H. Protik

Giuseppe Romano

Raphaël Butté , Jean-François Carlin, and Nicolas Grandjean

Institut für Festkörperphysik, Universität Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany

Department of Microtechnology and Nanoscience, Chalmers University of Technology, SE-41296 Gothenburg, Sweden

Department of Physics and CSMB, Humboldt-Universität zu Berlin, 12489 Berlin, Germany

MIT-IBM Watson AI Lab, IBM Research, Cambridge, Massachusetts, USA

Institute of Physics, École Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzerland

^*Also at MAPEX Center for Materials and Processes, Universität Bremen, Bibliotheksstraße 1, 28359 Bremen, Germany
^†Contact author: gcallsen@uni-bremen.de

Frequency-domain thermoreflectance for micro- and nanoscale thermal metrology: Principles, instrumentation, and reliable parameter extraction

Ting Liu, Feng Chen, Jin Li, and Cunzhu Tong

Advanced Scientific Instruments 1 100037 (2026)

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ISSN 2331-7019 (online).

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