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Physical Review Applied

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Advanced Materials (1)Phys. Rev. Applied (1)

Articles Citing

Nanoscale wireframe SQUID on a cantilever by corner lithography

Thijs J. Roskamp ¹, Tim Horstink ², Melissa J. Goodwin ¹, Erwin Berenschot¹, Edin Sarajilic², Roeland Huijink ², Niels Tas¹, and Hans Hilgenkamp ^1,*

¹Faculty of Science and Technology and MESA+ Institute, University of Twente, 7500 AE Enschede, The Netherlands
²Bruker Nano Surfaces & Metrology, De Veldmaat 17, 7522 NM Enschede, The Netherlands

^*Contact author: j.w.m.hilgenkamp@utwente.nl

Nanoscale wireframe SQUID on a cantilever by corner lithography

Thijs J. Roskamp, Tim Horstink, Melissa J. Goodwin, Erwin Berenschot, Edin Sarajilic, Roeland Huijink, Niels Tas, and Hans Hilgenkamp

Phys. Rev. Applied 26 034054 (2026)

Real‐Space Mapping of Emergent Correlated Electronic States With Scanning SQUID Microscopy

Aoshen Yang, Xiangyu Bi, Ganyu Chen, Zeya Li, Junwei Huang, and Hongtao Yuan

Advanced Materials 38 e74406 (2026)

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ISSN 2331-7019 (online).

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