We present a magnetic-imaging technique for investigating materials with perpendicular magnetic anisotropy using a conventional atomic force microscope. In this method, the $\mathrm{Si}$ tip acts as a thermal anchor, generating localized lateral temperature gradients in a heated nanowire. The resulting anomalous Nernst effect is measured at both ends of the wire. For uniform out-of-plane magnetization, the anomalous Nernst voltage reverses the sign as the tip scans from edge to edge, reflecting the direction of the local temperature gradient. By simulating this gradient, the anomalous Nernst thermopower can be quantitatively determined. Furthermore, this technique enables the visualization of magnetic multidomain structures. Overall, it provides a simple, quantitative, and practical approach to magnetic imaging using widely available atomic-force-microscopy setups.

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• Magnetic anisotropy
• Magnetic domains
• Nernst effect
• Spintronics
• Ferromagnets
• Magnetic multilayers
• Atomic force microscopy
• Magnetization measurements