Export citation

Export citation

Choose format for download:

Download Citation

    Modulating low-power-threshold optical bistability by electrically reconfigurable free-electron Kerr nonlinearity

    Huatian Hu (胡华天)1,*, Gonzalo Álvarez-Pérez1, Antonio Valletta2, Marialilia Pea3, Michele Ortolani3,4,5, and Cristian Ciracì1,†,‡

    • *Contact author: huatian.hu@iit.it
    • †Contact author: cristian@neurophos.com
    • ‡Current address: Neurophos Inc., 4120 Freidrich Ln, Austin, TX 78744 United States.

    Phys. Rev. Applied 24, 044006 – Published 2 October, 2025

    DOI: https://doi.org/10.1103/rpdw-vp1n

    Abstract

    Efficient active control of optical nonlinearity has long been a critical goal for advancing nonlinear optoelectronic devices. However, this remains a significant challenge, as nonlinear susceptibilities are inherently dictated by the microscopic properties of materials. In this work, we propose a microscopic mechanism to electrically reconfigure the Kerr nonlinearity by modulating the concentration of free electrons in heavily doped semiconductors under a static bias. Our theory incorporates electrostatic and hydrodynamic frameworks to describe the electronic dynamics, demonstrating electrically tunable linear and nonlinear modulations. The power threshold of achieving optical bistability shows unprecedented tunability over 2 orders of magnitude, reaching values as low as 10μW through surface-charge control. These findings offer insights into understanding and actively controlling Kerr nonlinearities, paving the way for efficient refractive-index engineering as well as the development of advanced linear and nonlinear electro-optical modulators

    Physics Subject Headings (PhySH)

    Authorization Required

    We need you to provide your credentials before accessing this content.

    Supplemental Material (Subscription Required)

    References (Subscription Required)

    Outline

    Information

    Sign In to Your Journals Account

    Filter

    Filter

    Article Lookup

    Enter a citation