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    Carbon nanowalls integrated on silicon nitride waveguide for photothermoelectric near-infrared detection

    Alexandr M. Mumlyakov1,*, Nikita Yu. Dmitriev1,2, Maksim V. Shibalov1, Ivan A. Filippov1, Igor V. Trofimov1, Alexandr S. Rykov1, Nikolay V. Porokhov1, Sergey A. Sokolov1, Maksim S. Bitkov1 et al.

    Galina V. Molodtsova1, Egor V. Kungurtsev1, Igor A. Bilenko2,3, and Michael A. Tarkhov1

    • *Contact author: mumlyakov.a@inme-ras.ru

    Phys. Rev. Applied 26, 034022 – Published 10 September, 2026

    DOI: https://doi.org/10.1103/prk9-c4r6

    Abstract

    This paper presents a technology for fabricating microstructures based on carbon nanowalls (CNWs) integrated on silicon nitride (SiNx) waveguides. The step-by-step fabrication process is described, including chemical mechanical planarization, deposition of molybdenum contacts, selective etching of the upper SiOx buffer layer relative to SiNx, and plasma-enhanced chemical vapor deposition of CNWs. The photothermoelectric response of the structures was studied in the C-band, near the 1.55  μm wavelength. The results demonstrate that the primary mechanism of the response to the laser emission is the Seebeck effect, providing a maximum sensitivity of 0.037  V/W without thermal degradation of the CNWs. Furthermore, the amplitude-frequency response of the structures corresponds to that of a fourth-order Butterworth filter with a cutoff frequency of 13.4 kHz. The utilization of the Joule-heating-assisted enhancement allows for a 21.4-fold increase in the output signal amplitude, but it also reduces the bandwidth. These findings highlight the prospects for CNWs in integrated photonics for near-infrared emission detection.

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