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    Interlayer migration mechanism in a P2-type layered oxide cathode for enhanced phase stability and anionic redox activity

    Yibing Zhang1, Changxin Wang1, Peng Lv1,*, Chenchen Song1, Yaping Qi1, Dong Yan1,†, Yu Jia2,3,4, and Ying Bai1,‡

    • 1Henan Key Laboratory of High Efficiency Energy Conversion Science and Technology, Henan International Joint Laboratory of New Energy Materials and Devices, School of Physics and Electronics, Henan University, Kaifeng 475004, China
    • 2Key Laboratory for Special Functional Materials of the Ministry of Education, School of Materials Science and Engineering, Henan University, Kaifeng 475004, China
    • 3Institute of Quantum Materials and Physics, Henan Academy of Sciences, Zhengzhou 450046, China
    • 4Joint Center for Theoretical Physics (JCTP), Institute for Computational Materials Science, Henan University, Kaifeng 475004, China

    • *Contact author: lvpeng@henu.edu.cn
    • †Contact author: dyan@henu.edu.cn
    • ‡Contact author: ybai@henu.edu.cn

    Phys. Rev. Applied 25, 064040 – Published 10 June, 2026

    DOI: https://doi.org/10.1103/pks2-1xjw

    Abstract

    Layered oxides are regarded as highly promising cathode candidates for sodium-ion batteries (SIBs) due to their high-energy density. However, interlayer migration of dopant ions during the charge-discharge cycle process is widely considered detrimental to phase stability and electrochemical activity. Moreover, the origin of this migration and its link to phase transitions and anionic redox reaction (ARR) activity remain unclear due to the insufficient insight into the underlying thermodynamics and dynamics, thereby restricting further application. Herein, the classic NaxMnO2 cathode is taken as an example. From the perspective of lattice dynamics, we demonstrate that it is the soft vibration mode along the out-of-plane direction that triggers the interlayer migration of substituent Na from the transition metal (TM) layer to the alkali metal (AM) layer, with a low barrier of 0.11 eV/atom. Furthermore, the resulting stable pinning of substituent Na within the AM layer would act as a “pillar” to stabilize the P2-type layered structure and then effectively mitigate the P-to-O phase transition caused by interlayer sliding during charging-discharging. Moreover, the ARR activity can be effectively enhanced by elevating the O-2p band centers and adjusting the orbital distribution, which is attributed to the formation of Mn vacancies following interlayer migration. Finally, it is further confirmed via experimental evaluation that the proposed strategy can greatly improve the electrochemical performance of P2-NaxMnO2 due to the enhanced ARR activity and minimized structure changes. This study offers pivotal insights into the underlying physical mechanisms that govern ion interlayer migration and its correlation with ARR activity, thereby facilitating the fundamental design of advanced layered oxide cathode materials for SIBs.

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