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Versatile system for photoconductance decay measurement across a wide range of semiconductor materials

András Bojtor1,2, Dávid Krisztián1,2, Gábor Paráda2, Ferenc Korsós2, Sándor Kollarics1,3, Gábor Csősz1, Bence G. Márkus3,4, László Forró4, and Ferenc Simon1,3,5,*

  • *Contact author: simon.ferenc@ttk.bme.hu

Phys. Rev. Applied 25, 014055 – Published 23 January, 2026

DOI: https://doi.org/10.1103/pdrr-tpcm

Abstract

Time-resolved photoconductivity is widely used to characterize nonequilibrium charge-carrier lifetime, impurity content, and solar-cell efficiency in a broad range of semiconductors. Most measurements are limited to the detection of reflection of electromagnetic radiation at a single frequency and a single photoexciting light wavelength. We present a time-resolved photoconductivity instrument that enables broadband frequency detection (essentially from dc to 20GHz), temperature-dependent measurements, and multiple excitation photon energy. The measurement is realized with the help of a coplanar waveguide, which acts as an efficient antenna and whose performance was tested over 10MHz–10GHz. The instrument enables the study of surface and bulk charge-recombination specific processes.

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