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    Enhanced detection of electric field signals via squeezing-induced stochastic resonance

    Ya-Qi Wei1,2,3, Tai-Hao Cui3,4, Quan Yuan5,3, Pei-Dong Li3,4, Yuan-Zhang Dong3,4, Zhuo-Zhu Wu3,4, Ji Li6, Jia-Wei Wang3,4, Fei Zhou3 et al.

    Ming-Xiao Li1,2, Liang Chen3,*, Zhu-Jun Zheng1,2,†, and Mang Feng3,6,7,8,‡

    • *Contact author: liangchen@wipm.ac.cn
    • †Contact author: zhengzj@scut.edu.cn
    • ‡Contact author: mangfeng@wipm.ac.cn

    Phys. Rev. Applied 25, 054038 – Published 14 May, 2026

    DOI: https://doi.org/10.1103/nyxt-y3kl

    Abstract

    Stochastic resonance (SR) can amplify weak electric field signals in nonlinear systems by means of externally injected noises. Here, we propose and experimentally demonstrate a modified SR method, termed squeezing-induced SR, implemented in a system involving a trapped ion behaving as a Duffing oscillator. We find that squeezing the phase noise of the oscillator results in amplified fluctuations of the corresponding amplitude, which helps achieve the SR. Since no auxiliary noise source is needed, squeezing-induced SR may enhance the signal-to-noise ratio by 4.28±0.39 dB compared with conventional noise-induced SR under identical conditions of electric field detection. This technique offers a promising approach for developing atomic ion sensors to detect weak electric field signals.

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