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    Photon emission by hot-electron injection across a lateral p-n junction

    S. Norimoto1,*, R. Saxena1, P. See1, A. Nasir1, J.P. Griffiths2, C. Chen2, D.A. Ritchie2, and M. Kataoka1

    • *Contact author: shota-norimoto@aist.go.jp

    Phys. Rev. Applied 25, 064017 – Published 4 June, 2026

    DOI: https://doi.org/10.1103/m6nq-gmz2

    Abstract

    We demonstrate a method to generate photons by injecting hot electrons into a p-n junction within a GaAs/AlGaAs heterostructure. Hot electrons are generated by biasing across a mesoscopic potential in the n-type region and travel toward the p-type region through a quantum Hall edge channel in the presence of a magnetic field perpendicular to the substrate. The p-type region is created several microns away from the hot-electron emitter by inducing interfacial charges using a surface gate. The energy relaxation of the hot electrons is suppressed by separating the orbitals before and after longitudinal-optical phonon emission. This technique enables the hot electrons to reach the p-type region and to recombine with induced holes followed by photon emission. Hot-electron-induced hole recombination is confirmed by a peak around 810 nm in an optical spectrum that corresponds to excitonic recombination in a GaAs quantum well. An asymmetric structure observed in the optical spectrum as a function of the magnetic field originates from the chiral transport of the hot electrons in the Hall edge channel. We propose that the combination of our technology and an on-demand single-electron source would enable the development of an on-demand single-photon source embedded in a semiconductor wafer, which could accelerate the integration of on-chip scalable quantum optical circuits.

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