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    Fast measurement of attosecond-level relative timing jitter by a time-stretched self-coherent detection system

    Yujia Li1,2, Dongmei Huang1,2,*, Xiong Wu1, Yihuan Shi1, Alan Pak Tao Lau1, Feng Li2, and P. K. A. Wai1,2,3

    • 1Photonics Research Institute, Department of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hong Kong SAR, China
    • 2The Hong Kong Polytechnic University Shenzhen Research Institute, Shenzhen 518057, China
    • 3Department of Physics, Hong Kong Baptist University, Hong Kong, China

    • *Contact author: meihk.huang@polyu.edu.hk

    Phys. Rev. Applied 24, 024005 – Published 4 August, 2025

    DOI: https://doi.org/10.1103/h8x8-3ybc

    Abstract

    Timing measurement is crucial for ultrafast high-precision position detection and characterization of nonrepetitive physical processes in ultrafast lasers. In this work, we showed that timing jitter measurements at the attosecond level could be achieved by using a time-stretched self-coherent detection (TSSCD) system. A piezoelectric transducer was placed in the signal arm of the detection system and driven with a sinusoidal signal to induce the timing jitter signal to be measured. The modulation-induced fast timing jitter was then characterized by using a chirped swept signal. The TSSCD system had a high-frequency noise floor of about 2 × 10−13fs2/Hz and an integrated timing jitter noise less than 5 as. The measured timing jitter amplitude determined from integration of the power spectral density varied linearly with the driving voltage with a fitting R2 of 0.99999, and a timing jitter amplitude as low as about 1 as could be measured. The experimental results agree well with the results from numerical simulations. By using ultrafast high-precision measurements, an attosecond-level timing jitter emulated by a random 8-level pulse amplitude modulated sinusoidal signal is successfully measured, indicating its potential for application in optical signal data processing and communications.

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