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    High-resolution up-conversion imaging in the 10-μm band under incoherent illumination

    Zhaoqizhi Han1,2,3,*, Xiaohua Wang1,2,3,*, Jinpeng Li1,2,3, Bowen Liu1,2,3, Zhenghe Zhou1,2,3, He Zhang1,2,3, Yinhai Li1,2,3,4, Zhiyuan Zhou1,2,3,4,†, and Baosen Shi1,2,3,‡

    • *These authors contributed equally to this work.
    • †Contact author: zyzhouphy@ustc.edu.cn
    • ‡Contact author: drshi@ustc.edu.cn

    Phys. Rev. Applied 24, 044078 – Published 24 October, 2025

    DOI: https://doi.org/10.1103/fb93-8djl

    Abstract

    The long-wavelength infrared band exhibits significant utility in thermal signature acquisition, molecular spectral analysis, and other applications. The up-conversion detection technique enables effective signal transduction into the detection bandwidth of silicon-based photodetectors, facilitating high-sensitivity photodetection. We demonstrate high-resolution up-conversion imaging for incoherent thermal targets in the 10-μm spectral regime. Furthermore, this work presents a derivation of analytical models characterizing depth of field and astigmatic aberration in up-conversion imaging systems, which show good agreement between theoretical and experimental results. The results demonstrate generalization to various up-conversion imaging systems, providing critical insights for their design and optimization.

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