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    Double-layer all-optical inference via sequential nonlinear optical diffraction

    Oded Katz*,†, Ofer Mittelman†, Enav Shraga, and Alon Bahabad

    • Department of Physical Electronics, School of Electrical Engineering, Fleischman Faculty of Engineering, Tel-Aviv University, Tel-Aviv 69978, Israel

    • *Contact author: odedkatz@mail.tau.ac.il
    • †These authors contributed equally to this work.

    Phys. Rev. Applied 25, 064067 – Published 23 June, 2026

    DOI: https://doi.org/10.1103/cd67-l2b5

    Abstract

    We demonstrate a double-layer all-optical inference platform for classification using cascaded nonlinear diffraction. The system utilizes a dual-pass configuration through a nonlinear optical crystal, shaping a superposition of Laguerre-Gaussian modes across two layers to steer optical intensity into class-specific detector regions. By optimizing via an in situ genetic algorithm with 10 trainable degrees of freedom, we achieve 88.65% accuracy on the ten-class Modified National Institute of Standards and Technology (MNIST) dataset, leveraging crystal temperature as a critical hyperparameter to optimize noncollinear mode mixing. This work establishes a robust pathway for high-accuracy, low-complexity all-optical computing through structured light and cascaded nonlinear optical interactions.

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