Export citation

Export citation

Choose format for download:

Download Citation
  • Letter

Electron Round Lenses with Negative Spherical Aberration by a Tightly Focused Cylindrically Polarized Light Beam

Yuuki Uesugi*, Yuichi Kozawa, and Shunichi Sato

  • Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai 980-8577, Japan

  • *uesugi@tohoku.ac.jp

Phys. Rev. Applied 16, L011002 – Published 9 July, 2021

DOI: https://doi.org/10.1103/PhysRevApplied.16.L011002

Abstract

Free electrons moving in an optical standing wave field feel the ponderomotive potential, acting as a refractive-index medium in electron optics. Emerging technologies involving this potential have been proposed and realized in electron microscopy, such as electron phase-contrast imaging using a laser standing wave in an optical enhancement cavity. However, the interaction between electrons and a cylindrically distributed optical field has not been investigated despite its suitability for electron-optical imaging systems. In this study, we theoretically show that the divergence and convergence forces are provided by tightly focused cylindrically polarized light beams. The radially and azimuthally polarized beams with an annular profile are focused using a high-numerical-aperture optical lens. The intensity distributions at the focus function are concave and convex electron round lenses, respectively. The convex lens formed by the azimuthally polarized beam possesses negative (opposite sign) spherical aberration compared with conventional electron round lenses created by electrodes and magnetic coils. This remarkable result will contribute to the innovative design of electron-optical imaging systems and advances in matter-wave optics.

Physics Subject Headings (PhySH)

Authorization Required

We need you to provide your credentials before accessing this content.

References (Subscription Required)

Outline

Information

Sign In to Your Journals Account

Filter

Filter

Article Lookup

Enter a citation