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Membrane-Based Scanning Force Microscopy

David Hälg1,‡, Thomas Gisler1,‡, Yeghishe Tsaturyan2,†, Letizia Catalini2,3, Urs Grob1, Marc-Dominik Krass1, Martin Héritier1, Hinrich Mattiat4, Ann-Katrin Thamm1 et al.

Romana Schirhagl5, Eric C. Langman2,3, Albert Schliesser2,3, Christian L. Degen1, and Alexander Eichler1,*

  • 1Laboratory for Solid State Physics, ETH Zürich, Zürich 8093, Switzerland
  • 2Niels Bohr Institute, University of Copenhagen, Copenhagen 2100, Denmark
  • 3Center for Hybrid Quantum Networks, Niels Bohr Institute, University of Copenhagen, Copenhagen 2100, Denmark
  • 4Department of Physics, University of Basel, Basel 4056, Switzerland
  • 5Department of Biomedical Engineering, Groningen University, Groningen 9713 AW, Netherlands

  • *eichlera@ethz.ch
  • †Present address: Pritzker School of Molecular Engineering, University of Chicago, Chicago, Illinois 60637, USA.
  • ‡These authors contributed equally to this work.
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Phys. Rev. Applied 15, L021001 – Published 5 February, 2021

DOI: https://doi.org/10.1103/PhysRevApplied.15.L021001

Abstract

We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry—in our instrument, the substrate is vibrating and the scanning tip is at rest. We present topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.

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Force Scanning on a Shaky Membrane

Published 5 February, 2021

A microscope technique that visualizes small objects on a vibrating membrane could deliver atomically resolved MRI scans.

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Phys. Rev. Applied 15, L021001– Published 5 February, 2021
  • Received 16 October 2020
  • Accepted 23 December 2020
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