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    Si/diamond thermal boundary conductance enhanced by SiNx and amorphous carbon interlayers

    Khalid Zobaid Adnan, Tanvirul Abedien, and Tianli Feng*

    • *Contact author: tianli.feng@utah.edu

    Phys. Rev. Applied 25, 044013 – Published 6 April, 2026

    DOI: https://doi.org/10.1103/84jf-svtg

    Abstract

    Thermal boundary conductance (TBC) between silicon and diamond influences heat removal in next-generation electronics where Si and diamond serve as substrates or channels. In this paper, we report simulations of Si/diamond interfaces using machine-learning interatomic potential (MLIP)-driven molecular dynamics. MLIPs trained on ab initio Si/diamond heterostructures faithfully reproduce interfacial Si—C bonding and the phonon dispersions of bulk Si and diamond, whereas the classical Tersoff potential fails to capture these accurately. After quantum correction, the room-temperature TBC of a bare Si/diamond interface is 130MWm−2K−1, in close agreement with experiment (approximately 140MWm−2K−1), and far below predictions from Tersoff molecular dynamics (310MWm−2K−1) or a first-principles phonon-dispersion diffuse mismatch model (205MWm−2K−1). Adding a 1-nm-thick SiNx interlayer approximately doubles the TBC to 275MWm−2K−1, and replacing SiNx with amorphous carbon further increases it to 350MWm−2K−1. The density of states analysis reveals that the interlayer supplies a large portion of intermediate phonon modes that bridge Si and diamond. Finite-element device simulations indicate that these TBC improvements measurably reduce peak chip temperature. These results highlight interfacial-layer engineering as a potential route to improved thermal management in wide-band-gap electronics.

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