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    In situ quantum verification of polarization-stabilized optical channels

    Matthew L. Stevens1,2,*, Noah I. Wasserbeck2, Zachary Goisman1,2, Arefur Rahman1,2, John Michael Record2, Taman Truong2,3, Ariq Haqq2, Muneer Alshowkan4, Brian T. Kirby5,6 et al.

    Nils T. Otterstrom7 and Joseph M. Lukens1,2,4,†

    • *Contact author: steve515@purdue.edu
    • †Contact author: jlukens@purdue.edu

    Phys. Rev. Applied 25, 034090 – Published 30 March, 2026Erratum Phys. Rev. Applied 26, 039901 (2026)

    DOI: https://doi.org/10.1103/63wh-4x54

    Abstract

    The active stabilization of polarization channels is a task of growing importance as quantum networks move to deployed demonstrations over existing fiber infrastructure. However, the uniquely strict requirements for high-fidelity qubit transmission complicate the extent to which classical solutions may apply to future quantum networks, particularly in terms of recognizing noise sources present in low-flux, nonunitary channels. Here we introduce an in situ benchmarking approach that augments a classical polarization tracking system, limited to unitary correction, with simultaneously transmitted quantum light for ancilla-assisted process tomography of the full quantum map. Implemented in a quantum local-area network, our method uses the reconstructed map both to validate the classical compensation and to expose noise sources it fails to capture. A sliding measurement window that continuously updates the estimated quantum process further increases sensitivity to rapid channel fluctuations. Our results should unlock new opportunities for in situ channel characterization in quantum-classical coexistence networks.

    Physics Subject Headings (PhySH)

    Erratum

    Erratum: In situ quantum verification of polarization-stabilized optical channels [Phys. Rev. Applied 25, 034090 (2026)]

    Matthew L. Stevens, Noah I. Wasserbeck, Zachary Goisman, Arefur Rahman, John Michael Record, Taman Truong, Ariq Haqq, Muneer Alshowkan, Brian T. Kirby, Nils T. Otterstrom, and Joseph M. Lukens
    Phys. Rev. Applied 26, 039901 (2026)

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