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    Resolving the resolution-contrast conflict in x-ray phase-contrast tomography via physics-constrained wavelet fusion

    Penghao Geng1,*, Meili Qi2,*, Yang Zou1, Detian Li1, Benxue Liu3, and Shengkun Yao1,†

    • 1Shandong Provincial Key Laboratory of Light Field Manipulation Physics and Applications & School of Physics and Optoelectronics, Shandong Normal University, Ji’nan 250358, China
    • 2School of Transportation Civil Engineering, Shandong Jiaotong University, Ji’nan 250357, China
    • 3State Key Laboratory of Crystal Materials, Shandong University, Ji’nan, Shandong 250100, China

    • *These authors contribution equally to this work.
    • †Contact author: yaoshk@sdnu.edu.cn

    Phys. Rev. Applied 25, 024027 – Published 9 February, 2026

    DOI: https://doi.org/10.1103/5561-1vzc

    Abstract

    Phase-contrast x-ray imaging overcomes low contrast in lightweight materials but suffers from an inherent tradeoff between spatial resolution (SR) and contrast-to-noise ratio (CNR). We resolve this conflict through a physics-constrained wavelet fusion framework. By integrating high-SR direct reconstruction and high-CNR phase retrieval, our method leverages single-level Sym4 wavelet decomposition to separate low-frequency contrast (governed by refractive index gradients) and high-frequency edges (dominated by Fresnel diffraction). The compact support and near-symmetry of Sym4 align with the spatial scales of x-ray propagation at 20 cm, minimizing spectral leakage while suppressing artifacts. For porous polyether ether ketone (PEEK), fused images achieve SR of 7.27 µm (140% enhancement over phase retrieval) and CNR of 8.33 (20.8× improvement over direct reconstruction). Validation on ordinary Portland cement achieves an SR of 10.81 µm and a CNR of 11.48, outperforming traditional Fourier fusion. This approach demonstrates artifact-free visualization of sub-10-µm pore networks, providing a robust pathway for high-fidelity nondestructive testing of lightweight materials in material science and biomedical diagnostics.

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