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In situ correction of field errors induced by temperature gradient in cryogenic undulators

Takashi Tanaka1,2,*, Takamitsu Seike2, Akihiro Kagamihata2, Thomas Schmidt3, Alexander Anghel3, Mark Brügger3, Willy Bulgheroni3, Bruno Jakob3, and Hideo Kitamura1,2

  • 1RIKEN/SPring-8, Koto 1-1-1, Mikazuki, Sayo, Hyogo 679-5148, Japan
  • 2JASRI/SPring-8, Koto 1-1-1, Mikazuki, Sayo, Hyogo 679-5198, Japan
  • 3Paul Scherrer Institute, 5232 Villigen PSI, Switzerland

  • *ztanaka@spring8.or.jp

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