-Subshell Fluorescence Yields and the Radiative Transition at from and Decays
E. Karttunen, H. U. Freund, and R. W. Fink
Phys. Rev. A 4, 1695 (1971) - Published 1 November, 1971
High-resolution Ge(Li) and Si(Li) x-ray spectrometers and a wall-less anticoincidence multiwire proportional counter were used for coincidence measurements between various and x rays and x rays of Np (Z=93) and Cm () following decay of and , respectively. The effect of multiple vacancies in the shell was taken into account in the determination of the following mean -subshell fluorescence yields: , , , at ; and , , , , and at . The close agreement of the various mean -subshell fluorescence yields with that of the subshells for each element indicates that Coster-Kronig transitions are very strong in the shell. Including earlier measurements of mean -shell fluorescence yields at lower , corrected for multiple vacancies, and accepting Bhalla's theoretical calculations of radiative -subshell widths, one concludes that the nonradiative widths of the subshells are essentially constant from . Comparison of fluorescence yields of the shell and the and subshells at the same energy of the principal radiative transition (i. e., at different values of indicates that the ratio of radiative to Auger widths decreases from the to state, but remains constant from to . The resolution of the Si(Li) detector was sufficient to separate the radiative transitions from fillings of the - and -subshell groups, so that from and x-ray coincidences with the group of x rays, it was possible to determine the following quantities: at , respectively, and at . Thus, about 94% of -subshell vacancies undergo Coster-Kronig shifts to higher subshells before filling from and higher major shells occurs. Observation of the radiative transition was made for the first time in the high- region, and its intensity is in reasonable agreement with extrapolated theoretical predictions (6-7% of x rays filling -subshell vacancies). The radiative fraction in the Coster-Kronig yield is found to be about 2% in the region of , and at , respectively. The absolute emission rate of x rays from was measured with multiwire and single-wire proportional counters, and values are found of (6.35 ± 0.60) × x rays per decay and 0.470 ± 0.045 x rays per x ray. These intensities were used in determinations of efficiency at 3.25 keV of the semiconductor x-ray detectors.