Shucheng Guo¹, Qingan Cai⁷, Douglas L. Abernathy⁸, Travis Williams⁸, Kostiantyn V. Kravchyk^4,5, Maksym V. Kovalenko^4,5, Georg K.H. Madsen⁹, Chen Li^2,7, and Xi Chen^1,†

• ¹Department of Electrical and Computer Engineering, University of California, Riverside, California 92507, USA
• ²Materials Science and Engineering, University of California, Riverside, California 92507, USA
• ³Instituto de Nanociencia y Materiales de Aragón (INMA), Spanish National Research Council (CSIC)—Universidad de Zaragoza, 50009 Zaragoza, Spain
• ⁴Laboratory for Thin Films and Photovoltaics, Empa—Swiss Federal Laboratories for Materials Science and Technology, Überlandstrasse 129, CH-8600 Dübendorf, Switzerland
• ⁵Laboratory of Inorganic Chemistry, Department of Chemistry and Applied Biosciences, ETH Zürich, Vladimir-Prelog-Weg 1, CH-8093 Zürich, Switzerland
• ⁶Materials Science and Engineering Program, Department of Mechanical Engineering, The University of Texas at Austin, Austin, Texas 78712, USA
• ⁷Department of Mechanical Engineering, University of California, Riverside, California 92507, USA
• ⁸Neutron Scattering Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA
• ⁹Institute of Materials Chemistry, TU Wien, Vienna A-1060, Austria

• ^*These authors contributed equally to this work.
• ^†Contact author: xichen@ucr.edu