Experimental setup for lensless x-ray diffraction microscopy that permits imaging near the nanometer scale. The sample (center plane) moves across x-rays from the 5 micron aperture (left plane), producing multiple diffraction patterns in the Fraunhofer plane (right).

From the article:

Hard-X-Ray Lensless Imaging of Extended Objects
J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson
Phys. Rev. Lett. 98, 034801 (2007)

View Issue Table of Contents