High-resolution images of multicrystalline silicon showing the faceted structure of the grain boundary, with the highlighted area showing the location and distribution of impurities. Selected for an Editors’ Suggestion.

From the article:

Strain-Induced Asymmetric Line Segregation at Faceted Si Grain Boundaries
Christian H. Liebscher, Andreas Stoffers, Masud Alam, Liverios Lymperakis, Oana Cojocaru-Mirédin, Baptiste Gault, Jörg Neugebauer, Gerhard Dehm, Christina Scheu, and Dierk Raabe
Phys. Rev. Lett. 121, 015702 (2018)

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