Scanning electron microscope images of silicon bilenses carefully designed to create a novel type of x-ray interferometer.

From the article:

X-Ray Nanointerferometer Based on Si Refractive Bilenses
A. Snigirev, I. Snigireva, V. Kohn, V. Yunkin, S. Kuznetsov, M. B. Grigoriev, T. Roth, G. Vaughan, and C. Detlefs
Phys. Rev. Lett. 103, 064801 (2009)

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