- Physical Review Journals
All JournalsPhysics Magazine

Physical Review Letters

Reuse & Permissions

It is not necessary to obtain permission to reuse this article or its components as it is available under the terms of the Creative Commons Attribution 4.0 International license. This license permits unrestricted use, distribution, and reproduction in any medium, provided attribution to the author(s) and the published article's title, journal citation, and DOI are maintained. Please note that some figures may have been included with permission from other third parties. It is your responsibility to obtain the proper permission from the rights holder directly for these figures.

Export citation

Export citation

Choose format for download:

Download Citation
  • Open Access

Strumming a Single Chemical Bond

Alfred J. Weymouth*, Elisabeth Riegel, Oliver Gretz, and Franz J. Giessibl

  • University of Regensburg, 93053 Regensburg, Germany

  • *jay.weymouth@ur.de
PDF

Phys. Rev. Lett. 124, 196101 – Published 11 May, 2020

DOI: https://doi.org/10.1103/PhysRevLett.124.196101

Abstract

Atomic force microscopy and scanning tunneling microscopy can image the internal structure of molecules adsorbed on surfaces. One reliable method is to terminate the tip with a nonreactive adsorbate, often a single CO molecule, and to collect data at a close distance where Pauli repulsion plays a strong role. Lateral force microscopy, in which the tip oscillates laterally, probes similar interactions but has the unique ability to pull the CO over a chemical bond, load it as a torsional spring, and release it as it snaps over with each oscillation cycle. This produces measurable energy dissipation. The dissipation has a characteristic decay length in the vertical direction of 4 pm, which is 13 times smaller than the decay length in typical STM or AFM experiments.

View figure in article

Physics Subject Headings (PhySH)

Article Text

Supplemental Material

References (40)

  1. L. Gross, F. Mohn, N. Moll, P. Liljeroth, and G. Meyer, The chemical structure of a molecule resolved by atomic force microscopy, Science 325, 1110 (2009).
  2. N. Moll, L. Gross, F. Mohn, A. Curioni, and G. Meyer, The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips, New J. Phys. 12, 125020 (2010).
  3. L. Gross, F. Mohn, N. Moll, G. Meyer, R. Ebel, W. M. Abdel-Mageed, and M. Jaspars, Organic structure determination using atomic-resolution scanning probe microscopy, Nat. Chem. 2, 821 (2010).
  4. S. Kawai, T. Nishiuchi, T. Kodama, P. Spijker, R. Pawlak, T. Meier, J. Tracey, T. Kubo, E. Meyer, and A. S. Foster, Direct quantitative measurement of the C=O...H-C bond by atomic force microscopy, Sci. Adv. 3, e1603258 (2017).
  5. K. Kaiser, L. M. Scriven, F. Schulz, P. Gawel, L. Gross, and H. L. Anderson, An sp-hybridized molecular carbon allotrope, cyclo[18]carbon, Science 365, 1299 (2019).
  6. C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Atomic-Scale Friction of a Tungsten Tip on a Graphite Surface, Phys. Rev. Lett. 59, 1942 (1987).
  7. L. Prandtl, Ein Gedankenmodell zur kinetischen Theorie der festen Körper, Z. Angew. Math. Mech. 8, 85 (1928).
  8. D. Tománek, W. Zhong, and H. Thomas, Calculation of an atomically modulated friction force in atomic-force microscopy, Europhys. Lett. 15, 887 (1991).
  9. O. Pfeiffer, R. Bennewitz, A. Baratoff, E. Meyer, and P. Grütter, Lateral-force measurements in dynamic force microscopy, Phys. Rev. B 65, 161403(R) (2002).
  10. F. J. Giessibl, M. Herz, and J. Mannhart, Friction traced to the single atom, Proc. Natl. Acad. Sci. U.S.A. 99, 12006 (2002).
  11. D. Rugar, R. Budakian, H. J. Mamin, and B. W. Chui, Single spin detection by magnetic resonance force microscopy, Nature (London) 430, 329 (2004).
  12. A. J. Weymouth, E. Riegel, S. Matencio, and F. J. Giessibl, Evaluating the potential energy landscape over single molecules at room temperature with lateral force microscopy, Appl. Phys. Lett. 112, 181601 (2018).
  13. L. Bartels, G. Meyer, and K.-H. Rieder, Controlled vertical manipulation of single CO molecules with the scanning tunneling microscope: A route to chemical contrast, Appl. Phys. Lett. 71, 213 (1997).
  14. F. J. Giessibl, High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork, Appl. Phys. Lett. 73, 3956 (1998).
  15. A. J. Weymouth, Non-contact lateral force microscopy, J. Phys. Condens. Matter 29, 323001 (2017).
  16. A. Gerlach, S. Sellner, F. Schreiber, N. Koch, and J. Zegenhagen, Substrate-dependent bonding distances of PTCDA: A comparative x-ray standing-wave study on Cu(111) and Ag(111), Phys. Rev. B 75, 045401 (2007).
  17. V. G. Ruiz, W. Liu, E. Zojer, M. Scheffler, and A. Tkatchenko, Density-Functional Theory with Screened van der Waals Interactions for the Modeling of Hybrid Inorganic-Organic Systems, Phys. Rev. Lett. 108, 146103 (2012).
  18. T. Wagner, A. Bannani, C. Bobisch, H. Karacuban, and R. Möller, The initial growth of PTCDA on Cu(111) studied by STM, J. Phys. Condens. Matter 19, 056009 (2007).
  19. C. Weiss, C. Wagner, C. Kleimann, M. Rohlfing, F. S. Tautz, and R. Temirov, Imaging Pauli Repulsion in Scanning Tunneling Microscopy, Phys. Rev. Lett. 105, 086103 (2010).
  20. L. Gross, F. Mohn, N. Moll, B. Schuler, A. Criado, E. Guitián, D. Peńa, A. Gourdon, and G. Meyer, Bond-order discrimination by atomic force microscopy, Science 337, 1326 (2012).
  21. P. Hapala, G. Kichin, C. Wagner, F. S. Tautz, R. Temirov, and P. Jelínek, Mechanism of high-resolution STM/AFM imaging with functionalized tips, Phys. Rev. B 90, 085421 (2014).
  22. M. P. Boneschanscher, S. K. Hämäläinen, P. Liljeroth, and I. Swart, Sample corrugation affects the apparent bond lengths in atomic force microscopy, ACS Nano 8, 3006 (2014).
  23. A. J. Weymouth, T. Hofmann, and F. J. Giessibl, Quantifying molecular stiffness and interaction with lateral force microscopy, Science 343, 1120 (2014).
  24. F. J. Giessibl, Forces and frequency shifts in atomic-resolution dynamic-force microscopy, Phys. Rev. B 56, 16010 (1997).
  25. See the Supplemental Material at http://link.aps.org/supplemental/10.1103/PhysRevLett.124.196101 for additional information about the materials and methods, as well as supplemental figures 1 to 4. Code for the strumming simulation is provided as FindAngleCC.m and CalcEdissDf.m.
  26. P. Jelinek, High resolution SPM imaging of organic molecules with functionalized tips, J. Phys. Condens. Matter 29, 343002 (2017).
  27. F. J. Giessibl, Advances in atomic force microscopy, Rev. Mod. Phys. 75, 949 (2003).
  28. H. Hölscher, B. Gotsmann, W. Allers, U. D. Schwarz, H. Fuchs, and R. Wiesendanger, Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique, Phys. Rev. B 64, 075402 (2001).
  29. M. Ondráček, P. Hapala, and P. Jelínek, Charge-state dynamics in electrostatic force spectroscopy, Nanotechnology 27, 274005 (2016).
  30. L. L. Patera, F. Queck, P. Scheuerer, and J. Repp, Mapping orbital changes upon electron transfer with tunnelling microscopy on insulators, Nature (London) 566, 245 (2019).
  31. S. Hembacher, F. J. Giessibl, J. Mannhart, and C. F. Quate, Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite, Phys. Rev. Lett. 94, 056101 (2005).
  32. N. Oyabu, P. Pou, Y. Sugimoto, P. Jelinek, M. Abe, S. Morita, R. Pérez, and Ó. Custance, Single Atomic Contact Adhesion and Dissipation in Dynamic Force Microscopy, Phys. Rev. Lett. 96, 106101 (2006).
  33. D. Sawada, Y. Sugimoto, M. Abe, and S. Morita, Observation of subsurface atoms of the Si(111)- (7×7) surface by atomic force microscopy, Appl. Phys. Express 3, 116602 (2010).
  34. S. A. Ghasemi, S. Goedecker, A. Baratoff, T. Lenosky, E. Meyer, and H. J. Hug, Ubiquitous Mechanisms of Energy Dissipation in Noncontact Atomic Force Microscopy, Phys. Rev. Lett. 100, 236106 (2008).
  35. M. Gajdoš and J. Hafner, CO adsorption on Cu(111) and Cu(001) surfaces: Improving site preference in DFT calculations, Surf. Sci. 590, 117 (2005).
  36. C. Moreno, O. Stetsovych, T. K. Shimizu, and O. Custance, Imaging three-dimensional surface objects with submolecular resolution by atomic force microscopy, Nano Lett. 15, 2257 (2015).
  37. G. Binnig, H. Rohrer, C. Gerber, and E. Weibel, Tunneling through a controllable vacuum gap, Appl. Phys. Lett. 40, 178 (1982).
  38. F. J. Giessibl, Atomic resolution of the silicon (111)- (7×7) surface by atomic force microscopy, Science 267, 68 (1995).
  39. T. L. Cocker, D. Peller, P. Yu, J. Repp, and R. Huber, Tracking the ultrafast motion of a single molecule by femtosecond orbital imaging, Nature (London) 539, 263 (2016).
  40. J. Lee, K. T. Crampton, N. Tallarida, and V. A. Apkarian, Visualizing vibrational normal modes of a single molecule with atomically confined light, Nature (London) 568, 78 (2019).

Outline

Information

Phys. Rev. Lett. 124, 196101– Published 11 May, 2020
  • Received 16 January 2020
  • Revised 2 March 2020
  • Accepted 8 April 2020
Crossmark - Check for updates button
Creative Commons Logo

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Published by the American Physical Society

Sign In to Your Journals Account

Filter

Filter

Article Lookup

Enter a citation