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    SENSEI at SNOLAB: Single-Electron Event Rate and Implications for Dark Matter

    Itay M. Bloch1,2, Ana M. Botti3,4, Mariano Cababie5,6,3, Gustavo Cancelo3, Brenda A. Cervantes-Vergara7, Miguel Daal8, Ansh Desai9, Alex Drlica-Wagner3,4,10, Rouven Essig11 et al. (SENSEI Collaboration)

    Rouven Essig11, Juan Estrada3, Erez Etzion8, Guillermo Fernandez Moroni3, Stephen E. Holland12, Jonathan Kehat8, Ian Lawson13, Steffon Luoma13, Aviv Orly8, Santiago E. Perez3,14,15, Dario Rodrigues14,15, Nathan A. Saffold3, Silvia Scorza16, Miguel Sofo-Haro3,17, Kelly Stifter3, Javier Tiffenberg3, Sho Uemura3, Edgar Marrufo Villalpando4, Tomer Volansky8, Federico Winkel14,15, Yikai Wu11,18, and Tien-Tien Yu9 (SENSEI Collaboration)

    Phys. Rev. Lett. 134, 161002 – Published 25 April, 2025

    DOI: https://doi.org/10.1103/PhysRevLett.134.161002

    Abstract

    We present results from data acquired by the SENSEI experiment at SNOLAB after a major upgrade in May 2023, which includes deploying 16 new sensors and replacing the copper trays that house the CCDs with a new light-tight design. We observe a single-electron event rate of (1.39±0.11)×10−5  e−/pix/day, corresponding to (39.8±3.1)  e−/gram/day. This is an order-of-magnitude improvement compared to the previous lowest single-electron rate in a silicon detector and the lowest for any photon detector in the wavelength range between near-infrared and ultraviolet. We use these data to obtain a 90% confidence level upper bound of 1.53×10−5  e−/pix/day and to set constraints on sub-GeV dark matter candidates that produce single-electron events. We hypothesize that the data taken at SNOLAB in the previous run, with an older tray design for the sensors, contained a larger rate of single-electron events due to light leaks. We test this hypothesis using data from the SENSEI detector located in the MINOS cavern at Fermilab.

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