- Featured in Physics
- Editors' Suggestion
- Open Access
Using Optical Tweezers to Simultaneously Trap, Charge, and Measure the Charge of a Microparticle in Air
Phys. Rev. Lett. 135, 218202 – Published 20 November, 2025
DOI: https://doi.org/10.1103/5xd9-4tjj
Abstract
Optical tweezers are widely used as a highly sensitive tool to measure forces on micron-scale particles. One such application is the measurement of the electric charge of a particle, which can be done with high precision in liquids, air, or vacuum. We experimentally investigate how the trapping laser itself can electrically charge such a particle, in our case a sphere in air. We model the charging mechanism as a two-photon process which reproduces the experimental data with high fidelity.
Physics Subject Headings (PhySH)
Collections
This article appears in the following collection:

PRL Collection of the Year 2025
For the second year in a row, our editors have curated a set of some of the best papers from the wide range of topics PRL covers in fundamental and applied physical science. Congratulations to all the authors in this collection!
synopsis
Getting a Charge from a Laser Beam
The laser that levitates a microscale particle can also charge it up, providing a useful tool for lab-based experiments for atmospheric science.
See more in Physics
Article Text
Supplemental Material
References (33)
- J. W. Merrill, S. K. Sainis, and E. R. Dufresne, Phys. Rev. Lett. 103, 138301 (2009).
- L. Mitchem and J. P. Reid, Chem. Soc. Rev. 37, 756 (2008).
- M. A. Mohajer, P. Basuri, A. Evdokimov, G. David, D. Zindel, E. Miliordos, and R. Signorell, Science 388, 1426 (2025).
- R. C. Sullivan, H. Boyer-Chelmo, K. Gorkowski, and H. Beydoun, Acc. Chem. Res. 53, 2498 (2020).
- D. B. Ruffner and D. G. Grier, Phys. Rev. Lett. 108, 173602 (2012).
- H. Rubinsztein-Dunlop, A. B. Stilgoe, D. Preece, A. Bui, and T. A. Nieminen, in Photonics (John Wiley & Sons, Inc., Hoboken, NJ, USA, 2015), pp. 287–339, 10.1002/9781119011781.ch7.
- R. A. Millikan, Phys. Rev. 2, 109 (1913).
- F. Beunis, F. Strubbe, B. Verboven, K. Neyts, and D. Petrov, Proc. SPIE 7613, 1 (2009)..
- F. Beunis, F. Strubbe, K. Neyts, and D. Petrov, Phys. Rev. Lett. 108, 016101 (2012).
- C. Schreuer, S. Vandewiele, F. Strubbe, K. Neyts, and F. Beunis, J. Colloid Interface Sci. 515, 248 (2018).
- C. Schreuer, S. Vandewiele, T. Brans, F. Strubbe, K. Neyts, and F. Beunis, J. Appl. Phys. 123, 015105 (2018).
- F. Ricci, M. T. Cuairan, G. P. Conangla, A. W. Schell, and R. Quidant, Nano Lett. 19, 6711 (2019).
- S. Zhu, Z. Fu, X. Gao, C. Li, Z. Chen, Y. Wang, X. Chen, and H. Hu, Photonics Res. 11, 279 (2023).
- G. Pesce, G. Rusciano, G. Zito, and A. Sasso, Opt. Express 23, 9363 (2015).
- M. Frimmer, K. Luszcz, S. Ferreiro, V. Jain, E. Hebestreit, and L. Novotny, Phys. Rev. A 95, 061801 (2017).
- J. T. Marmolejo, M. Urquiza-González, O. Isaksson, A. Johansson, R. Méndez-Fragoso, and D. Hanstorp, Sci. Rep. 11, 10703 (2021).
- F. Ricci, M. T. Cuairan, A. W. Schell, E. Hebestreit, R. A. Rica, N. Meyer, and R. Quidant, ACS Nano 16, 8677 (2022).
- J. Wang, C. Li, S. Zhu, C. He, Z. Fu, X. Zhu, Z. Chen, and H. Hu, Appl. Phys. Express 16, 066502 (2023).
- A. Ashkin and J. M. Dziedzic, Phys. Rev. Lett. 36, 267 (1976).
- O. Reich, M. J. Gleichweit, G. David, N. Leemann, and R. Signorell, Environ. Sci. Atmos. 3, 695 (2023).
- See Supplemental Material at http://link.aps.org/supplemental/10.1103/5xd9-4tjj for details on sample preparation, charge measurement, photoelectron yield spectroscopy, charging models, and additional data, which includes Refs. [22,23].
- D. Petersen, M. Bailey, J. Hallett, and W. Beasley, Q. J. R. Meteorol. Soc. 141, 1283 (2014).
- J. Bateman, S. Nimmrichter, K. Hornberger, and H. Ulbricht, Nat. Commun. 5, 4788 (2014).
- W. C. Hinds, Aerosol Technology: Properties, Behavior, and Measurement of Airborne Particles (John Wiley & Sons, Incorporated, New York, 1999).
- H. Ishii, S. Masuda, and Y. Harada, Surf. Sci. 239, 222 (1990).
- N. Fujimura, A. Ohta, K. Makihara, and S. Miyazaki, Jpn. J. Appl. Phys. 55, 08P (2016).
- M. L. O’Brien, C. Koitzsch, and R. J. Nemanich, J. Vac. Sci. Technol. B Microelectron. Nanometer Struct. Process. Meas. Phenom. 18, 1776 (2000).
- C. C. Fulton, G. Lucovsky, and R. J. Nemanich, J. Appl. Phys. 99, 063708 (2006).
- V. Astašauskas, A. Bellissimo, P. Kuksa, C. Tomastik, H. Kalbe, and W. S. M. Werner, J. Electron Spectrosc. Relat. Phenom. 241, 146829 (2020).
- D. L. Griscom, J. Non Cryst. Solids 73, 51 (1985).
- J. F. Wager, AIP Adv. 7, 125321 (2017).
- J. Singh and K. Shimakawa, Advances in Amorphous Semiconductors (Taylor & Francis, London, 2003).
- J. Frenkel, Phys. Rev. 54, 647 (1938).