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    Learning Midcircuit Measurement Backaction from Three Repeated Measurements

    Chia-Tung Chu1,2,*, Su-un Lee1,2, Han Zheng1,2, Senrui Chen1,†, Bibek Pokharel3, Alireza Seif3, and Liang Jiang1,2

    • *Contact author: ctchu@uchicago.edu
    • †Present address: Institute for Quantum Information and Matter, California Institute of Technology, Pasadena, California 91125, USA.

    Phys. Rev. Lett. 137, 180601 – Published 26 October, 2026

    DOI: https://doi.org/10.1103/y6x3-348l

    Abstract

    Accurate modeling of midcircuit measurements (MCMs) is essential for dynamic-circuit operations such as syndrome extraction, measurement-based reset, and the separation of state-preparation and measurement error. Unlike terminal measurement, a noisy MCM both produces a classical outcome and alters the incoming quantum state, thereby influencing subsequent circuit operations. This makes conventional confusion-matrix or fidelity-level characterization insufficient. Here, we introduce an efficient, self-consistent protocol for learning a single-qubit Z-twirled MCM instrument, retaining the readout-backaction correlations and excitation-decay asymmetry that are erased in Pauli-error descriptions. Remarkably, readout bit strings from only three repeated MCMs on a maximally mixed input determine all learnable parameters of the reduced instrument, up to a single unidentifiable gauge degree of freedom. Physicality constraints convert this nonidentifiability into narrow, gauge-aware error intervals. Implemented on IBM superconducting processors, the learned instrument improves Pauli-observable prediction by ∼100× over a conventional confusion-matrix model and reveals a T1-decay dominated backaction. Our protocol provides a compact characterization layer for state-preparation and measurement error separation, reset optimization, and noise-aware quantum error correction.

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