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Breaking the Speed Limit of Chemical-Structure Imaging with Enhanced Force Sensitivity
Phys. Rev. Lett. 137, 046202 – Published 23 July, 2026
DOI: https://doi.org/10.1103/y4xr-dvwt
Abstract
Atomic force microscopy (AFM) with a functionalized tip can resolve the chemical structure of single molecules, but its application has been limited by slow imaging speeds and the restriction to constant-height operation. Here, we overcome these limitations by operating a Si cantilever in its second resonance mode, achieving exceptional force sensitivity. This enables robust, constant-height chemical-structure imaging at speeds up to 200 nm/s—over 60 times faster than previously reported. The enhanced sensitivity also resolves molecular bonds directly in constant-frequency-shift topographic images, a mode crucial for studying nonplanar systems. Our approach significantly expands the capabilities of AFM, opening new avenues for investigating the structure of three-dimensional molecules and tracking the dynamics of on-surface chemical reactions.
Physics Subject Headings (PhySH)
synopsis
Molecular Imaging Without the Wait
A new atomic force microscope captures the structures of individual molecules and their chemical bonds at record speeds.
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