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    Probing Defects with Quantum Simulator Snapshots

    Abhijat Sarma1, Nayan Myerson-Jain1, Yue Liu2, Nandagopal Manoj2, Jason Alicea2, Roger G. Melko3,4, and Cenke Xu1

    Phys. Rev. Lett. 136, 020603 – Published 14 January, 2026

    DOI: https://doi.org/10.1103/stk3-lm78

    Abstract

    Snapshots—i.e., projective measurements of local degrees of freedom—are the most standard data taken in experiments on quantum simulators, usually to probe local physics. In this Letter we propose a simple protocol to experimentally probe physics of defects with these snapshots. Our protocol relies only on snapshots from the bulk system, without introducing the defect explicitly; as such, the physics of different kinds of defects can be probed using the same dataset. In particular, we demonstrate that, with snapshots of local spin configurations of, for example, the 1d Rydberg atom realization of the quantum Ising criticality, we can (1) extract the “defect entropy” and (2) access the continuous line of fixed points of effective defect conformal field theory.

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