We demonstrate an electric-field-resolved approach for probing ultrafast dynamics of photoinjected charge carriers in solids. Direct access to the electric field of few-cycle pulses enables us to measure a broadband response of a medium with associated plasma frequency. We prepare an ensemble of hot charge carriers with energies sufficient to trigger impact ionization and establish a framework to measure its dynamics. Our time-resolved study reveals the short-lived ultrafast dynamics consistent with impact ionization and carrier trapping. This approach provides a promising route for studying ultrafast many-body physics in photoexcited solids, with predictions from advanced theoretical models.

Close

PrevNext

View figure in article

• Carrier dynamics
• Defects
• Dielectric properties
• Optical & microwave phenomena
• Photocurrent
• Polycrystalline materials
• Thin films
• Laser techniques
• Optical techniques