Current-Voltage Characteristics of Self-Assembled Monolayers by Scanning Tunneling Microscopy

Supriyo Datta, Weidong Tian, Seunghun Hong, R. Reifenberger, Jason I. Henderson, and Clifford P. Kubiak
Phys. Rev. Lett. 79, 2530 – Published 29 September 1997
PDFExport Citation

Abstract

This paper presents a comparison of the theoretical and experimental current-voltage (I-V) characteristics of a self-assembled monolayer of α,αxylyl dithiol molecules on a gold substrate measured with a scanning tunneling microscope probe. Good quantitative agreement is obtained with the tip-molecule distance as the only “fitting parameter.” Several other thiol-coupled molecules that we have studied also show similar agreement. The conceptual picture presented in this paper could be useful for the interpretation of I-V measurements on molecular monolayers in general.

  • Received 9 June 1997

DOI:https://doi.org/10.1103/PhysRevLett.79.2530

©1997 American Physical Society

Authors & Affiliations

Supriyo Datta and Weidong Tian

  • School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907-1285

Seunghun Hong and R. Reifenberger

  • Department of Physics, Purdue University, West Lafayette, Indiana 47907-1285

Jason I. Henderson and Clifford P. Kubiak

  • Department of Chemistry, Purdue University, West Lafayette, Indiana 47907-1285

References (Subscription Required)

Click to Expand
Issue

Vol. 79, Iss. 13 — 29 September 1997

Reuse & Permissions
Access Options
Collection
Heating up of Superconductors
January 27, 2017

This collection marks the 30th anniversary of the discovery of high-temperature superconductors. The papers selected highlight some of the advances that have been made to date, both in understanding why these compounds behave in the way they do, and in utilizing them in applications. The papers included in the collection have been made free to read.

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×