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Diffraction Regimes of Single Holes

J.-M. Yi, A. Cuche, F. de León-Pérez, A. Degiron, E. Laux, E. Devaux, C. Genet, J. Alegret, L. Martín-Moreno, and T. W. Ebbesen
Phys. Rev. Lett. 109, 023901 – Published 12 July 2012
Physics logo See Synopsis: A New Window on Nanometer Apertures
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Abstract

We investigate both experimentally and theoretically the far-field diffraction patterns of single circular apertures as a function of their diameters d and at a given illumination wavelength λ. We observe the transition between the well-known pseudoscalar regime of large holes (dλ) and the less-known vectorial regime of subwavelength ones (dλ). Four different diffraction regimes are identified for different d/λ regions, each one with its polarization dependence. A thorough comparison with a theoretical model, which takes into account both finite hole size and the dielectric properties of the metal, allows us to explain and understand the physical processes leading to this behavior. Our results reveal the subtle interplay between two competing factors, one related to polarization symmetries associated with surface-plasmon excitations and the other originating in the coupling of the field to the waveguide mode of the aperture.

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  • Received 2 February 2012

DOI:https://doi.org/10.1103/PhysRevLett.109.023901

© 2012 American Physical Society

Synopsis

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A New Window on Nanometer Apertures

Published 12 July 2012

Experiment and theory combine to give a more complete picture of a fundamental problem in diffraction optics.

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Authors & Affiliations

J.-M. Yi1, A. Cuche1, F. de León-Pérez2,3, A. Degiron1, E. Laux1, E. Devaux1, C. Genet1, J. Alegret3, L. Martín-Moreno3, and T. W. Ebbesen1

  • 1ISIS & icFRC, University of Strasbourg and CNRS, 8, allée Gaspard Monge, 67000 Strasbourg, France
  • 2Centro Universitario de la Defensa de Zaragoza, Carretera de Huesca, E-50090 Zaragoza, Spain
  • 3Instituto de Ciencia de Materiales de Aragón and Departamento de Física de la Materia Condensada, CSIC-Universidad de Zaragoza, E-50009 Zaragoza, Spain

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Issue

Vol. 109, Iss. 2 — 13 July 2012

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