Far-Infrared Conductivity Measurements of Pair Breaking in Superconducting Nb0.5Ti0.5N Thin Films Induced by an External Magnetic Field

Xiaoxiang Xi, J. Hwang, C. Martin, D. B. Tanner, and G. L. Carr
Phys. Rev. Lett. 105, 257006 – Published 16 December 2010
PDFHTMLExport Citation


We report the complex optical conductivity of a superconducting thin film of Nb0.5Ti0.5N in an external magnetic field. The field was applied parallel to the film surface and the conductivity extracted from far-infrared transmission and reflection measurements. The real part shows the superconducting gap, which we observe to be suppressed by the applied magnetic field. We compare our results with the pair-breaking theory of Abrikosov and Gor’kov and confirm directly the theory’s validity for the optical conductivity.

  • Figure
  • Figure
  • Figure
  • Received 16 August 2010


© 2010 The American Physical Society

Authors & Affiliations

Xiaoxiang Xi1, J. Hwang1,2, C. Martin1, D. B. Tanner1, and G. L. Carr3

  • 1Department of Physics, University of Florida, Gainesville, Florida 32611, USA
  • 2Department of Physics, Pusan National University, Busan 609-735, Republic of Korea
  • 3National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973, USA

Article Text (Subscription Required)

Click to Expand

Supplemental Material (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand

Vol. 105, Iss. 25 — 17 December 2010

Reuse & Permissions
Access Options
Heating up of Superconductors
January 27, 2017

This collection marks the 30th anniversary of the discovery of high-temperature superconductors. The papers selected highlight some of the advances that have been made to date, both in understanding why these compounds behave in the way they do, and in utilizing them in applications. The papers included in the collection have been made free to read.

Authorization Required




Sign up to receive regular email alerts from Physical Review Letters

Log In



Article Lookup

Paste a citation or DOI

Enter a citation