Lifetime and Coherence of Two-Level Defects in a Josephson Junction

Yoni Shalibo, Ya’ara Rofe, David Shwa, Felix Zeides, Matthew Neeley, John M. Martinis, and Nadav Katz
Phys. Rev. Lett. 105, 177001 – Published 19 October 2010
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We measure the lifetime (T1) and coherence (T2) of two-level defect states (TLSs) in the insulating barrier of a Josephson phase qubit and compare to the interaction strength between the two systems. We find for the average decay times a power-law dependence on the corresponding interaction strengths, whereas for the average coherence times we find an optimum at intermediate coupling strengths. We explain both the lifetime and the coherence results using the standard TLS model, including dipole radiation by phonons and anticorrelated dependence of the energy parameters on environmental fluctuations.

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  • Received 14 July 2010


© 2010 The American Physical Society

Authors & Affiliations

Yoni Shalibo1, Ya’ara Rofe1, David Shwa1, Felix Zeides1, Matthew Neeley2, John M. Martinis2, and Nadav Katz1

  • 1Racah Institute of Physics, The Hebrew University of Jerusalem, Jerusalem 91904, Israel
  • 2Department of Physics, University of California, Santa Barbara, California 93106, USA

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Vol. 105, Iss. 17 — 22 October 2010

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