Raman efficiency in SiGe alloys

A. Picco, E. Bonera, E. Grilli, M. Guzzi, M. Giarola, G. Mariotto, D. Chrastina, and G. Isella
Phys. Rev. B 82, 115317 – Published 21 September 2010


Raman spectroscopy is commonly used for the optical characterization of structural properties of SiGe alloys but a measurement of the Raman efficiency as a function of excitation wavelength and concentration is still lacking. This information is nevertheless important for the interpretation of data, especially for the analysis of inhomogeneous samples. In this work, the relative Raman efficiency of Si1xGex alloys has been obtained for several excitation energies as a function of the composition x with steps of Δx0.02 across the whole composition range. We observed resonances in correspondence of the E1/E1+Δ1 and E0/E0+Δ0 transitions. For a fixed excitation energy the efficiency varies of about 2 orders of magnitude vs the composition of the alloy, while, for a fixed composition, we observed a change in efficiency of up to 3 orders of magnitude depending on the excitation energy. The maximum scattering efficiency at resonance decreases by an order of magnitude when moving from silicon-rich to germanium-rich alloys. The data are discussed in terms of the polarizability and compared to the literature relative to pure silicon and germanium. The data reported in this paper can be used to design experiments under resonant conditions to selectively probe different regions in inhomogeneous samples.

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  • Received 8 June 2010


©2010 American Physical Society

Authors & Affiliations

A. Picco, E. Bonera, E. Grilli, and M. Guzzi

  • Dipartimento di Scienza dei Materiali, Università degli Studi di Milano-Bicocca, via Cozzi 53, I-20125 Milano, Italy

M. Giarola and G. Mariotto

  • Dipartimento di Informatica, Università di Verona, strada le Grazie 15, I-37134 Verona, Italy

D. Chrastina and G. Isella

  • LNESS, Dipartimento di Fisica, Politecnico di Milano, Polo Regionale di Como, via Anzani 42, I-22100 Como, Italy

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Vol. 82, Iss. 11 — 15 September 2010

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