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    Interface stability in hybrid metal-oxide magnetic trilayer junctions

    J. Z. Sun

    K. P. Roche and S. S. P. Parkin

    • IBM T. J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598

    • IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120

    Phys. Rev. B 61, 11244 – Published 1 May, 2000

    DOI: https://doi.org/10.1103/PhysRevB.61.11244

    Abstract

    We show that for hybrid oxide-metal trilayer junctions of Co0.8Fe0.2SrTiO3La0.67Sr0.33MnO3 and FeSrTiO3La0.67Sr0.33MnO3, the sign and field dependence of junction magnetoresistance are sensitive to the junction interface condition. Both positive and negative magnetoresistance can be obtained in either system, depending on the state of the junction interface. For high biases above 0.5 V, junction resistance shows time-dependent creep. The magnitude and direction of the creep depend on the magnitude and direction of the applied bias, indicating reversible structural modification of the junction interface. For these junctions, the interface chemistry, rather than fundamental band structures of the electrode materials, appears responsible for the observed sign-change of junction magnetoresistance.

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