Export citation

Export citation

Choose format for download:

Download Citation

    Dilatometric and X-Ray Thermal Expansion in Noncubic Crystals. I. Role of Dislocation Climb

    A. S. Nowick

    R. Feder

    • Henry Krumb School of Mines, Columbia University, New York, New York 10027

    • IBM Watson Research Center, Yorktown Heights, New York 10598

    Phys. Rev. B 5, 1238 – Published 15 February, 1972

    DOI: https://doi.org/10.1103/PhysRevB.5.1238

    Abstract

    Comparison of macroscopic (dilatometric) and microscopic (x-ray) precision thermal-expansion measurements at elevated temperatures has been widely used to obtain the equilibrium concentration of vacancies in cubic crystals. For noncubic crystals these measurements must be made in more than one orientation (e.g., in axial crystals, along both the c and a axes). Such measurements give information not only on the equilibrium vacancy concentration, but also on the relative rates of climb of the various dislocations in the crystal, which act as sources and sinks for the vacancies. Quantitative expressions are obtained for the ratio ΔcΔa, where Δ is the difference between fractional macroscopic and microscopic linear expansions along the c or a direction in an axial crystal. Consideration is given to the two extreme cases of dislocation climb, viz., the diffusion limited and climb-rate limited cases. An important point is that the measurements, in general, will be sample dependent, so that the samples of different orientation must be taken from the same single crystal.

    Authorization Required

    We need you to provide your credentials before accessing this content.

    References (Subscription Required)

    Outline

    Information

    Sign In to Your Journals Account

    Filter

    Filter

    Article Lookup

    Enter a citation