Abstract
The bulk chemical processes responsible for defect equilibria in hydrogenated amorphous silicon (a-Si:H) are examined. Thermodynamic analyses of the corresponding chemical reactions are shown to account quantitatively for the observed defect-state-energy distribution and dependence of the defect concentration on temperature and Fermi energy. The dependence of a-Si:H defect properties on growth conditions is addressed.
- Received 16 January 1990
DOI:https://doi.org/10.1103/PhysRevB.41.12150
©1990 American Physical Society

