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Defect formation in a-Si:H

K. Winer
Phys. Rev. B 41, 12150 – Published 15 June 1990
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Abstract

The bulk chemical processes responsible for defect equilibria in hydrogenated amorphous silicon (a-Si:H) are examined. Thermodynamic analyses of the corresponding chemical reactions are shown to account quantitatively for the observed defect-state-energy distribution and dependence of the defect concentration on temperature and Fermi energy. The dependence of a-Si:H defect properties on growth conditions is addressed.

  • Received 16 January 1990

DOI:https://doi.org/10.1103/PhysRevB.41.12150

©1990 American Physical Society

Authors & Affiliations

K. Winer

  • Xerox Corporation, Palo Alto Research Center, Palo Alto, California 94304

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Vol. 41, Iss. 17 — 15 June 1990

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