Abstract
Hall-coefficient and dc-conductivity measurements have been made, with use of the van der Pauw geometry, on uncompensated Si:As samples on both sides of the metal-insulator transition (7.77×<N<32.8× , 8.55×<<8.60× ) in the temperature range 300 to 0.5 K. Much of the data was taken in temperature sweeps between 4.2 and 0.5 K at magnetic fields between 0.5 and 15 T. The insulating samples exhibit variable-range-hopping (VRH) behavior for (N,H,T) that is similar to the VRH behavior of σ(N,H,T) and is Mott VRH in the temperature range of these experiments. The ratio of the Hall VRH characteristic temperature and the Mott characteristic temperature as H→0 and N→ is in good agreement with the theoretical prediction of Gruenewald et al. that (/=5/8. The metallic results indicate (n,H,T)≃(n,H)[1+(n,H)] at sufficiently low temperature, analogous to earlier results for σ(n,H,T) and suggest a coefficient of the term for of order ∼1.5. The values of (n, H→0, T→0 K) do not show the apparent critical behavior observed for Ge:Sb, Kr:Bi, and a-Si:Pt and are essentially in agreement with the weak-localization theoretical predictions of Fukuyama and of Shapiro and Abrahams. It is speculated that the differing ‘‘critical behavior’’ of these metal-insulator systems results from a spin-orbit contribution (extraordinary contribution) to the Hall coefficient.
- Received 5 October 1989
DOI:https://doi.org/10.1103/PhysRevB.41.12054
©1990 American Physical Society

