- Open Access
Electron capture in low-energy collisions of ions with and
Phys. Rev. A 112, 052806 – Published 5 November, 2025
DOI: https://doi.org/10.1103/x84b-5kcn
Abstract
We report experimental single-electron-capture cross sections for ions impacting on and molecules at low projectile energies, ranging from 0.8 to 153 eV/u. The data were obtained in a crossed-beam-type experiment with a decelerated ion beam and a gas target. Charge-state resolved Sn ion currents are measured with a retarding field analyzer. After an extensive description of the setup and measurement procedure, we present and discuss the results in comparison to model calculations. Ab initio calculations of potential energy curves, including spin-orbit interactions, are performed and used to fit a four-state diabatic model. The experimental and theoretical single-electron-capture cross sections show good agreement and are found to have values in the range of 20– with a shallow maximum around 10 eV/u. We do not observe a significant difference between the cross sections for and , as hinted at in our previous work at energies of 80–400 eV/u.
Physics Subject Headings (PhySH)
Article Text
References (58)
- H. Weisen, M. von Hellermann, A. Boileau, L. D. Horton, W. Mandl, and H. P. Summers, Nucl. Fusion 29, 2187 (1989).
- R. C. Isler, Plasma Phys. Controlled Fusion 36, 171 (1994).
- R. Hoekstra, H. Anderson, F. W. Bliek, M. von Hellermann, C. F. Maggi, R. E. Olson, and H. P. Summers, Plasma Phys. Controlled Fusion 40, 1541 (1998).
- M. Reich, E. Wolfrum, J. Schweinzer, H. Ehmler, L. Horton, J. Neuhauser, and A. U. Team, Plasma Phys. Controlled Fusion 46, 797 (2004).
- O. P. Ford, L. Vanó, J. A. Alonso, J. Baldzuhn, M. N. A. Beurskens, C. Biedermann, S. A. Bozhenkov, G. Fuchert, B. Geiger, D. Hartmann, R. J. E. Jaspers, A. Kappatou, A. Langenberg, S. A. Lazerson, R. M. McDermott, P. McNeely, T. W. C. Neelis, N. A. Pablant, E. Pasch, N. Rust et al., Rev. Sci. Instrum. 91, 023507 (2020).
- T. E. Cravens, Geophys. Res. Lett. 24, 105 (1997).
- D. Bodewits, R. Hoekstra, B. Seredyuk, R. W. McCullough, G. H. Jones, and A. G. G. M. Tielens, Astrophys. J. 642, 593 (2006).
- O. O. Versolato, Plasma Sources Sci. Technol. 28, 083001 (2019).
- S. Rai, K. I. Bijlsma, L. Poirier, E. de Wit, L. Assink, A. Lassise, I. Rabadán, L. Méndez, J. Sheil, O. O. Versolato, and R. Hoekstra, Plasma Sources Sci. Technol. 32, 035006 (2023).
- V. Y. Banine, K. N. Koshelev, and G. H. P. M. Swinkels, J. Phys. D: Appl. Phys. 44, 253001 (2011).
- EUV Lithography, 2nd ed., edited by V. Bakshi (SPIE Press, Bellingham, 2018).
- G. O'Sullivan, B. Li, R. D'Arcy, P. Dunne, P. Hayden, D. Kilbane, T. McCormack, H. Ohashi, F. O'Reilly, P. Sheridan, E. Sokell, C. Suzuki, and T. Higashiguchi, J. Phys. B: At. Mol. Opt. Phys. 48, 144025 (2015).
- F. Torretti, J. Sheil, R. Schupp, M. M. Basko, M. Bayraktar, R. A. Meijer, S. Witte, W. Ubachs, R. Hoekstra, O. O. Versolato, A. J. Neukirch, and J. Colgan, Nat. Commun. 11, 2334 (2020).
- S. Fujioka, H. Nishimura, K. Nishihara, M. Murakami, Y.-G. Kang, Q. Gu, K. Nagai, T. Norimatsu, N. Miyanaga, Y. Izawa, K. Mima, Y. Shimada, A. Sunahara, and H. Furukawa, Appl. Phys. Lett. 87, 241503 (2005).
- J. R. Freeman, S. S. Harilal, B. Verhoff, A. Hassanein, and B. Rice, Plasma Sources Sci. Technol. 21, 055003 (2012).
- A. Bayerle, M. J. Deuzeman, S. van der Heijden, D. Kurilovich, T. de Faria Pinto, A. Stodolna, S. Witte, K. S. E. Eikema, W. Ubachs, R. Hoekstra, and O. O. Versolato, Plasma Sources Sci. Technol. 27, 045001 (2018).
- L. Poirier, A. Lassise, Y. Mostafa, L. Behnke, N. Braaksma, L. Assink, R. Hoekstra, and O. O. Versolato, Appl. Phys. B 128, 135 (2022).
- D. Nakamura, K. Tamaru, Y. Hashimoto, T. Okada, H. Tanaka, and A. Takahashi, J. Appl. Phys. 102, 123310 (2007).
- I. Fomenkov, D. Brandt, A. Ershov, A. Schafgans, Y. Tao, G. Vaschenko, S. Rokitski, M. Kats, M. Vargas, M. Purvis, R. Rafac, B. La Fontaine, S. De Dea, A. LaForge, J. Stewart, S. Chang, M. Graham, D. Riggs, T. Taylor, M. Abraham et al., Adv. Opt. Techn. 6, 173 (2017).
- T. Wu, X. Wang, H. Lu, and P. Lu, J. Phys. D 45, 475203 (2012).
- D. Abramenko, M. Spiridonov, P. Krainov, V. Krivtsun, D. Astakhov, V. Medvedev, M. van Kampen, D. Smeets, and K. Koshelev, Appl. Phys. Lett. 112, 164102 (2018).
- N. Bartlett, A. Herschberg, J. Crouse, T. Dallal, J. Nuttal, J. Stahl, N. Braaksma, and D. Ruzic, Phys. Scr. 99, 065411 (2024).
- J. Scheers, C. Shah, A. Ryabtsev, H. Bekker, F. Torretti, J. Sheil, D. A. Czapski, J. C. Berengut, W. Ubachs, J. R. Crespo López-Urrutia, R. Hoekstra, and O. O. Versolato, Phys. Rev. A 101, 062511 (2020).
- J. Sheil, L. Poirier, A. C. Lassise, D. J. Hemminga, S. Schouwenaars, N. Braaksma, A. Frenzel, R. Hoekstra, and O. O. Versolato, Phys. Rev. Lett. 133, 125101 (2024).
- R. A. Burdt, Y. Ueno, Y. Tao, S. Yuspeh, M. S. Tillack, and F. Najmabadi, Appl. Phys. Lett. 97, 041502 (2010).
- A. Niehaus, J. Phys. B: At. Mol. Phys. 19, 2925 (1986).
- S. Rai, K. I. Bijlsma, I. Rabadán, L. Méndez, P. A. J. Wolff, M. Salverda, O. O. Versolato, and R. Hoekstra, Phys. Rev. A 106, 012804 (2022).
- R. Geller, Rev. Sci. Instrum. 69, 1302 (1998).
- R. A. Phaneuf, C. C. Havener, G. H. Dunn, and A. Müller, Rep. Prog. Phys. 62, 1143 (1999).
- B. van Zyl, N. Utterback, and R. Amme, Rev. Sci. Instr. 47, 814 (1976).
- C. C. Havener, M. S. Huq, H. F. Krause, P. A. Schultz, and R. A. Phaneuf, Phys. Rev. A 39, 1725 (1989).
- R. Hoekstra, J. P. M. Beijers, A. R. Schlatmann, R. Morgenstern, and F. J. de Heer, Phys. Rev. A 41, 4800 (1990).
- G. Lubinski, Z. Juhász, R. Morgenstern, and R. Hoekstra, Phys. Rev. Lett. 86, 616 (2001).
- L. Oltra, L. Méndez, I. Rabadán, K. Bijlsma, E. de Wit, and R. Hoekstra, Phys. Rev. Lett. 134, 093002 (2025).
- E. Bodewits, H. Bekker, A. de Nijs, R. Hoekstra, D. Winklehner, B. Daniel, G. Kowarik, K. Dobes, and F. Aumayr, Nucl. Instrum. Methods Phys. Res., Sect. B 269, 1203 (2011).
- S. T. de Zwart, A. G. Drentje, A. L. Boers, and R. Morgenstern, Surf. Sci. 217, 298 (1989).
- J. Rajput, A. Roy, D. Kanjilal, R. Ahuja, and C. P. Safvan, Rev. Sci. Instrum. 81, 043301 (2010).
- G. Lubinski, Z. Juhász, R. Morgenstern, and R. Hoekstra, J. Phys. B: At. Mol. Opt. Phys. 33, 5275 (2000).
- Y. Sakai and I. Katsumata, Jpn. J. Appl. Phys. 24, 337 (1985).
- K. Bijlsma, L. Oltra, E. D. Wit, L. Assink, I. Rabadán, L. Méndez, and R. Hoekstra, Atoms 12, 9 (2024).
- J. R. Machacek, D. P. Mahapatra, D. R. Schultz, Yu. Ralchenko, A. Chutjian, J. Simcic, and R. J. Mawhorter, Phys. Rev. A 90, 052708 (2014).
- B. O. Roos, R. Lindh, P. Malmqvist, V. Veryazov, and P. Widmark, J. Phys. Chem. A 108, 2851 (2004).
- P. Widmark, P. Malmqvist, and B. O. Roos, Theor. Chim. Acta 77, 291 (1990).
- L. F. Errea, A. Maciás', L. Méndez, I. Rabadán, and A. Riera, Int. J. Mol. Sci. 3, 142 (2002).
- L. F. Errea, L. Fernández, L. Méndez, B. Pons, I. Rabadán, and A. Riera, Phys. Rev. A 75, 032703 (2007).
- M. Douglas and N. M. Kroll, Ann. Phys. 82, 89 (1974).
- B. A. Hess, Phys. Rev. A 33, 3742 (1986).
- P. E. M. Siegbahn, J. Almlöf, A. Heiberg, and B. O. Roos, J. Chem. Phys. 74, 2384 (1981).
- J. Finley, P. Malmqvist, B. O. Roos, and L. Serrano-Andrés, Chem. Phys. Lett. 288, 299 (1998).
- G. Ghigo, B. O. Roos, and P. Malmqvist, Chem. Phys. Lett. 396, 142 (2004).
- B. A. Heß, C. M. Marian, U. Wahlgren, and O. Gropen, Chem. Phys. Lett. 251, 365 (1996).
- R. Llusar, M. Casarrubios, Z. Barandiarán, and L. Seijo, J. Chem. Phys. 105, 5321 (1996).
- P. Malmqvist, B. O. Roos, and B. Schimmelpfennig, Chem. Phys. Lett. 357, 230 (2002).
- W. Domcke, D. R. Yarkony, and H. Köppel, Conical Intersections (World Scientific, Singapore, 2004).
- K. Haris and A. Tauheed, Phys. Scr. 85, 055301 (2012).
- M. Kimura, T. Iwai, Y. Kaneko, N. Kobayashi, A. Matsumoto, S. Ohtani, K. Okuno, S. Takagi, H. Tawara, and S. Tsurubuchi, J. Phys. Soc. Jpn. 53, 2224 (1984).
- V. Sidis, Advances in Atomic, Molecular, and Optical Physics (Academic, New York, 1989), Vol. 26, pp. 161–208.
- B. Johnson, J. Comput. Phys. 13, 445 (1973).