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    Non-Abelian topological charges determined by Euler class

    Yu Huang1, Jiayun Ning1, Keran Hu1, Linsheng Bao1, Aoqian Shi1, Shilong Li1, and Jianjun Liu1,2,*

    • 1Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education, School of Physics and Electronics, Hunan University, Changsha, Hunan 410082, China
    • 2Greater Bay Area Institute for Innovation, Hunan University, Guangzhou, Guangdong 511300, China

    • *Contact author: jianjun.liu@hnu.edu.cn

    Phys. Rev. A 114, 013515 – Published 15 July, 2026

    DOI: https://doi.org/10.1103/kyzv-9lsh

    Abstract

    The interplay between multiple bands gives rise to non-Abelian defects, which are typically characterized by corresponding non-Abelian topological charges. Here we present a practical and intuitive approach for determining the non-Abelian topological charge of a defect based on its associated two-band Euler classes, without requiring knowledge of the Euler class of a defect pair. The approach is illustrated using a parity-time-symmetric tight-binding model that hosts braiding defects on a two-dimensional square lattice, and the resulting topological charges are consistent with those obtained from conventional spin Berry-Wilczek-Zee connection integrals. The factorization of the non-Abelian topological charge carried by a defect is naturally encoded in a set of two-band Euler classes, thereby elucidating the mechanism underlying defect formation.

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