We present a compact, ionization-based detector for the state-selective and spatially resolved measurement of individual Rydberg atoms located in the vicinity of an atom chip. The system combines an electrostatic lens system for guiding charged particles with an array of channel electron multipliers (CEMs) capable of detecting both ions and electrons produced by ionization. Designed for quantum information applications, this device enables the detection of correlations between spatially separated Rydberg qubits by guiding charged particles from different positions onto the $2\times 2$ CEM array. The ion-optical magnification defines the particle trajectories and, together with the detector geometry, determines the minimal atom separation that can be resolved. The imaging system achieves a total magnification above 12 and up to 200 along a single axis while maintaining low aberrations. We characterize the performance of the system using a charged particle trajectory simulation software and discuss how a coincidence measurement of ions and electrons can be used to calibrate the detection efficiency. This detector enables high-fidelity measurement of multiple Rydberg atoms and is well suited for applications in cavity-mediated quantum gates.

Close

PrevNext

View figure in article

• Atom optics
• Electron beams & optics
• Quantum optics
• Rydberg atoms & molecules
• Correlation function measurements