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    Binned-detector probability distributions for Gaussian boson sampling validation

    Gabriele Bressanini1,*, Benoit Seron2,3,†, Leonardo Novo2,‡, Nicolas J. Cerf3, and M. S. Kim1

    • *Contact author: gabriele.bressanini@gmail.com
    • †Contact author: benoitseron@gmail.com
    • ‡Contact author: leonardo.novo@inl.int

    Phys. Rev. A 112, 012610 – Published 11 July, 2025

    DOI: https://doi.org/10.1103/jqvf-pm1r

    Abstract

    Gaussian boson sampling (GBS), a computational problem conjectured to be hard to simulate on a classical machine, has been at the forefront of recent years' experimental and theoretical efforts to demonstrate quantum advantage. The classical intractability of the sampling task makes validating these experiments a challenging and essential undertaking. In this paper, we propose binned-detector probability distributions as a suitable quantity to statistically validate GBS experiments employing photon-number-resolving detectors. We develop the theoretical framework to compute such distributions by leveraging their connection with their respective characteristic function. The latter may be efficiently and analytically computed for squeezed input states as well as for relevant classical hypothesis like squashed states. Our theoretical framework encompasses other validation methods based on marginal distributions and correlation functions. Additionally, it can analytically accommodate various sources of noise, such as losses and partial distinguishability, a feature that has received limited attention within the GBS framework so far. We also derive how binned-detector probability distributions behave when Haar averaged over all possible interferometric networks, extending known results for Fock boson sampling.

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