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    Single-photon-assisted strong-field ionization

    Lin Feng1, Peipei Ge1,*, Weibin Liu1, Yang Liu1, Min Li1,†, and Peixiang Lu1,2

    • *Contact author: gepeipei@hust.edu.cn
    • †Contact author: mli@hust.edu.cn

    Phys. Rev. A 113, 053109 – Published 13 May, 2026

    DOI: https://doi.org/10.1103/hwjc-5zsw

    Abstract

    We investigate strong-field ionization of helium atoms exposed to an intense infrared (IR) laser field assisted by a weak extreme-ultraviolet (XUV) field, where the XUV photon energy is below the ionization potential of helium, prohibiting direct single-photon ionization. Despite its low intensity, the XUV field enhances the ionization probability by nearly 3 orders of magnitude compared to the case with the IR field alone. By varying the XUV intensity, we demonstrate that this enhancement stems from strong-field ionization assisted by single-XUV-photon absorption. Using the strong-field approximation model, we disentangle the contributions of direct and rescattered electrons to the photoelectron energy spectrum. Our results reveal that direct ionization is primarily enhanced near the zero crossing of the IR field, whereas rescattered electron ionization is enhanced near the field maximum.

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