Export citation

Export citation

Choose format for download:

Download Citation

    Fine-Structure Measurement of Singly Ionized Helium, n=4

    Ralph R. Jacobs*, Kenneth R. Lea, and Willis E. Lamb, Jr.

    • Yale University, New Haven, Connecticut 06520

    • *Present address: General Telephone and Electronics Laboratories, Bayside, N. Y.

    Phys. Rev. A 3, 884 – Published 1 March, 1971

    DOI: https://doi.org/10.1103/PhysRevA.3.884

    Abstract

    Precision measurements of the energy differences S4(4S122−4P122) and ΔE4−S4(4P322−4S122) in (He4)+ are reported. The experimental results, S4=1768±5 MHz and ΔE4−S4=20179.7±1.2 MHz, agree with the values predicted by quantum electrodynamic theory, S4=1768.34±0.51 MHz and ΔE4−S4=20180.78±0.56 MHz. An electron gun excites the states of interest in a section of waveguide containing helium gas. A magnetic field applied perpendicular to the waveguide axis is used to scan a microwave resonance between suitable Zeeman levels for a fixed frequency of oscillating electric field in the waveguide. Any induced electric dipole transitions 4S122→4P122 or 4S122→4P322 reduce the intensity of 1215-Å radiation which is emitted in the natural decay of 4S to 2P. This light is directed onto an ultraviolet-detecting phototube whose output is measured by a lock-in detector for which the synchronous signal is provided by square-wave amplitude modulation of the microwave field. The resonances obtained by varying the magnetic field are fitted to a theoretical line-shape formula by a computerized least-squares program. The resulting best-fit parameters include either S4 or ΔE4−S4, depending on the transition studied. Consideration is given to the dependence of the resonance center on the gun current, helium pressure, and microwave power level.

    Authorization Required

    We need you to provide your credentials before accessing this content.

    References (Subscription Required)

    Outline

    Information

    Sign In to Your Journals Account

    Filter

    Filter

    Article Lookup

    Enter a citation